Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM (Hardback)
Published by Springer-Verlag New York Inc., United States (2011)
ISBN 10: 0387258000 ISBN 13: 9780387258003
About this Item: Springer-Verlag New York Inc., United States, 2011. Hardback. Condition: VG 1st ed. 2005. Corr. 2nd printing 2011. Language: English.
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy